A quantitative metric for research impact using patent citation analytics.

A quantitative metric for research impact using patent citation analytics.

Journal article

1 volume.

A new metric for Research Impact index is presented using only X-type and Y-type patent examiner citations cited during prosecution of patents where the patent family must have at least one US patent family member, where the citations are de-duplicated (to remove double counting associated with duplicate Patent Examiner citations from different jurisdictions when examining the same invention), and where the citations are for both non-patent publications and patent publications, where academics are, respectively, the authors and inventors. The quantitative outcomes are demonstrated using a 10-year dataset of 22,255 publications from the Faculty of Engineering and IT at the University of Technology Sydney.

Crossref

World Patent Information, 71, December, 2022.

World Patent Information

Oxford [England] : Elsevier Ltd., 2022

eng

https://www.sciencedirect.com/science/article/abs/pii/S0172219022000333

External Online Journals > World Patent Information