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A quantitative metric for research impact using patent citation analytics.
2022
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Cite
Citation
Details
Title
A quantitative metric for research impact using patent citation analytics.
Item Type
Journal article
Description
1 volume.
Summary
A new metric for Research Impact index is presented using only X-type and Y-type patent examiner citations cited during prosecution of patents where the patent family must have at least one US patent family member, where the citations are de-duplicated (to remove double counting associated with duplicate Patent Examiner citations from different jurisdictions when examining the same invention), and where the citations are for both non-patent publications and patent publications, where academics are, respectively, the authors and inventors. The quantitative outcomes are demonstrated using a 10-year dataset of 22,255 publications from the Faculty of Engineering and IT at the University of Technology Sydney.
Source of Description
Crossref
Series
World Patent Information, 71, December, 2022.
In
World Patent Information
Linked Resources
Published
Oxford [England] : Elsevier Ltd., 2022
Language
English
Copyright Information
https://www.sciencedirect.com/science/article/abs/pii/S0172219022000333
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