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A quantitative metric for research impact using patent citation analytics.
2022
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Cite
Citation
Detalles
Título
A quantitative metric for research impact using patent citation analytics.
Tipo de elemento
Journal article
Descripción
1 volume.
Resúmen
A new metric for Research Impact index is presented using only X-type and Y-type patent examiner citations cited during prosecution of patents where the patent family must have at least one US patent family member, where the citations are de-duplicated (to remove double counting associated with duplicate Patent Examiner citations from different jurisdictions when examining the same invention), and where the citations are for both non-patent publications and patent publications, where academics are, respectively, the authors and inventors. The quantitative outcomes are demonstrated using a 10-year dataset of 22,255 publications from the Faculty of Engineering and IT at the University of Technology Sydney.
Source of Description
Crossref
Serie
World Patent Information, 71, December, 2022.
En
World Patent Information
Recursos vinculados
Publicado
Oxford [England] : Elsevier Ltd., 2022
Lengua(s)
eng
Derechos de autor
https://www.sciencedirect.com/science/article/abs/pii/S0172219022000333
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