\(
\def\WIPO{World Intellectual Property Organisation}
\)
One year deferred examination as viewed by the German Patent Office / Kurt Haertel.
1970
DE 34
Available at WIPO Library
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Items
Detalles
Título
One year deferred examination as viewed by the German Patent Office / Kurt Haertel.
Autor
Tipo de elemento
Journal article
Descripción
1 volume ([14] pages) ; [28] cm.
Número de llamada alternativo
DE 34
Serie
International Review Of Industrial Property (IIC) ; 1970 Vol 1 No 1 pages 4-18.
Publicado
[Heidelberg, Germany] : [Springer], 1970.
Lengua(s)
eng
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