\(
\def\WIPO{World Intellectual Property Organisation}
\)
One year deferred examination as viewed by the German Patent Office / Kurt Haertel.
1970
DE 34
Available at WIPO Library
Items
Details
Title
One year deferred examination as viewed by the German Patent Office / Kurt Haertel.
Author
Haertel, Kurt, author.
Item Type
Journal article
Description
1 volume ([14] pages) ; [28] cm.
Alternate Call Number
DE 34
Series
International Review Of Industrial Property (IIC) ; 1970 Vol 1 No 1 pages 4-18.
Published
[Heidelberg, Germany] : [Springer], 1970.
Language
English
Record Appears in
all