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\def\WIPO{World Intellectual Property Organisation}
\)
One year deferred examination as viewed by the German Patent Office / Kurt Haertel.
1970
DE 34
Available at WIPO Library
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Items
تفاصيل
Title
One year deferred examination as viewed by the German Patent Office / Kurt Haertel.
Author
نوع المادة
Journal article
الوصف
1 volume ([14] pages) ; [28] cm.
Alternate Call Number
DE 34
السلسلة
International Review Of Industrial Property (IIC) ; 1970 Vol 1 No 1 pages 4-18.
Published
[Heidelberg, Germany] : [Springer], 1970.
اللغة(لغات)
eng
السجل يظهر فى