1.
Guide for developing countries on the examination of patent applications.
World Intellectual Property Organization
Geneva [Switzerland] : World Intellectual Property Organization, 1982-
English | E 224G411 WIPO.G(A) (E/F/S) |
Detailed record - Similar records
2.
Japanese Patent Office examination guideline for inventions using microcomputers / David S. Guttman.
Guttman, David S., author.
[Place of publication not identified] : [publisher not identified], 1983.
English | 20 JP |
Detailed record - Similar records
3.
Detailed record - Similar records
4.
After Lear v Adkins modern administrative law? / David G. Redinbaugh.
Redinbaugh, David G., author.
Buffalo, New York : The Patent and Trademark Office Society, 1970.
English | G 411(413) US 47 |
Detailed record - Similar records
5.
Post issue proceedings : worthwhile or not? / Ernest K. Bean.
Bean, Ernest K., author. ; Chapman, Leland L. ; Fisher, Thomas E.
Buffalo, New York : The Patent and Trademark Office Society, 1969.
English | 47 US |
Detailed record - Similar records
6.
Avdelte og utskilte patentsoknader / Birger Finnan.
Finnan, Birger, author.
Stockholm [Sweden] : Nordiskt Immateriellt Rättsskydd (NIR), 1971.
Danish | 3 SE |
Detailed record - Similar records
7.
China's patent reexamination and invalidation in 1990 / Yuanguo Zhao.
Zhao, Yuanguo, author.
[Hong Kong, China] : [China Patents & Trademarks Publications], 1991.
English | 7 CN |
Detailed record - Similar records
8.
Detailed record - Similar records
9.
Scope of protection of a German patent / G.B. Hagen.
Hagen, G. B., author.
Buffalo, New York : The Patent and Trademark Office Society, 1973.
English | 47 US |
Detailed record - Similar records
10.
Detailed record - Similar records