TY  - BOOK
DO  - 10.1016/j.wpi.2022.102130
DO  - doi
T1  - Measuring generative appropriability:Experiments with US semiconductor patents /
AU  - Denter, Nils M.,
AU  - Lai, Mei Yun,
JF  - World Patent Information
VL  - 70, September, 2022.
LA  - eng
ID  - 46859
KW  - Patents.
TI  - Measuring generative appropriability:Experiments with US semiconductor patents /
LK  - https://doi.org/10.1016/j.wpi.2022.102130
UR  - https://doi.org/10.1016/j.wpi.2022.102130
ER  -