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000003784 035__ $$a(OCoLC)1161370087
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000003784 043__ $$an-us---
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000003784 1001_ $$aFryer Iii, William T.,$$eauthor.
000003784 24510 $$aNew United States patent re-examination process :$$ba background, explanation and analysis /$$cFryer Iii, William T.
000003784 264_1 $$aLondon, England :$$bSweet & Maxwell,$$c1981.
000003784 300__ $$a1 volume ([4] pages) ;$$c[28] cm.
000003784 336__ $$atext$$btxt$$2rdacontent
000003784 337__ $$aunmediated$$bn$$2rdamedia
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000003784 4901_ $$aEuropean Intellectual Property Review ;$$v1981 Vol 3 No 10 pages 290-294
000003784 650_0 $$aPatents$$zUnited States.
000003784 650_0 $$aIntellectual property$$zUnited States.
000003784 650_4 $$aPATENT RE-EXAMINATION
000003784 650_4 $$aUNITED STATES OF AMERICA
000003784 650_6 $$aPropriété industrielle (Droit international)
000003784 651_0 $$aAmerica$$xCommerce$$xLaw and legislation.
000003784 651_0 $$aUnited States$$xCommerce$$xLaw and legislation.
000003784 830_0 $$aEuropean Intellectual Property Review ;$$v1981 Vol 3 No 10 pages 290-294.
000003784 903__ $$v1$$aEUROPEAN INTELLECTUAL PROPERTY REVIEW
000003784 904__ $$aJournal article
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000003784 952__ $$w2006-11-03$$p1991-24222$$r0.00$$u3995$$bMAIN$$10$$kGB 10$$v1991-04-10$$zLibrary$$70
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