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Are all patent examiners equal? The impact of characteristics on patent statistics and litigation outcomes / Iain M. Cockburn.
Cockburn, Iain M., author.
;
Kortum, Samue.
;
Stern, Scot.
2002
G 411 COC.A
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Title
Are all patent examiners equal? The impact of characteristics on patent statistics and litigation outcomes / Iain M. Cockburn.
Author
Cockburn, Iain M., author.
Kortum, Samue.
Stern, Scot.
Edition
8980.
Description
42 pages ; [28] cm.
Alternate Call Number
G 411 COC.A
Note
No. 8980 ; NBER Working Paper Series ; 2002.
Series
National Bureau of Economic Research (NBER) Working Paper Series, no. 8980 1
Series
National Bureau Of Economic Research (NBER) Working Paper Series, ; No. 8980.
Published
Cambridge, Ma : National Bureau Of Economic Research, 2002.
Language
English
Record Appears in
General collection
Browse Subjects
Patents
United States.
PATENT EXAMINATION SYSTEM
PATENT RIGHTS
PATENT SYSTEM : UNITED STATES
United States
Commerce
Law and legislation.
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