TY  - GEN
T1  - Are all patent examiners equal? The impact of characteristics on patent statistics and litigation outcomes /
AU  - Cockburn, Iain M.,
AU  - Kortum, Samue.
AU  - Stern, Scot.
ET  - 8980.
VL  - No. 8980
N1  - No. 8980 ; NBER Working Paper Series ; 2002.
ID  - 13399
KW  - Patents
KW  - PATENT EXAMINATION SYSTEM
KW  - PATENT RIGHTS
KW  - PATENT SYSTEM : UNITED STATES
TI  - Are all patent examiners equal? The impact of characteristics on patent statistics and litigation outcomes /
ER  -