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Is deferred examination of patent applications desirable in the United States / Edward F. Mckie.
1973
47 US
Available at WIPO Library
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Items
Detalles
Título
Is deferred examination of patent applications desirable in the United States / Edward F. Mckie.
Tipo de elemento
Journal article
Descripción
1 volume ([20] pages) ; [28] cm.
Número de llamada alternativo
47 US
Serie
Journal Of The Patent And Trademark Office Society ; 1973 Vol 55 No 11 pages 691-711.
Publicado
Buffalo, New York : The Patent and Trademark Office Society, 1973.
Lengua(s)
eng
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