TY  - GEN
T1  - Is deferred examination of patent applications desirable in the United States /
AU  - Mckie, Edward F.,
VL  - 1973 Vol 55 No 11 pages 691-711
ID  - 10783
KW  - Patents
KW  - Trademarks
TI  - Is deferred examination of patent applications desirable in the United States /
ER  -